List of materials analysis methods

List of materials analysis methods:

Contents:

Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

• μSR - see Muon spin spectroscopy
• χ - see Magnetic susceptibility

A

• Analytical ultracentrifugation - Analytical ultracentrifugation
• AAS - Atomic absorption spectroscopy
• AED - Auger electron diffraction
• AES - Auger electron spectroscopy
• AFM - Atomic force microscopy
• AFS - Atomic fluorescence spectroscopy
• APFIM - Atom probe field ion microscopy
• APS - Appearance potential spectroscopy
• ARPES - Angle resolved photoemission spectroscopy
• ARUPS - Angle resolved ultraviolet photoemission spectroscopy
• ATR - Attenuated total reflectance

B

• BET - BET surface area measurement (BET from Brunauer, Emmett, Teller)
• BiFC - Bimolecular fluorescence complementation
• BKD - Backscatter Kikuchi diffraction, see EBSD
• BRET - Bioluminescence resonance energy transfer
• BSED - Back scattered electron diffraction, see EBSD

C

• CAICISS - Coaxial impact collision ion scattering spectroscopy
• CARS - Coherent anti-Stokes Raman spectroscopy
• CBED - Convergent beam electron diffraction
• CCM - Charge collection microscopy
• CDI - Coherent diffraction imaging
• CE - Capillary electrophoresis
• CET - Cryo-electron tomography
• CL - Cathodoluminescence
• CLSM - Confocal laser scanning microscopy
• COSY - Correlation spectroscopy
• Cryo-EM - Cryo-electron microscopy
• CV - Cyclic voltammetry

D

• DE(T)A - Dielectric thermal analysis
• dHvA - De Haas-van Alphen effect
• DIC - Differential interference contrast microscopy
• Dielectric spectroscopy - Dielectric spectroscopy
• DLS - Dynamic light scattering
• DLTS - Deep-level transient spectroscopy
• DMA - Dynamic mechanical analysis
• DPI - Dual polarisation interferometry
• DRS - Differential reflectance spectroscopy
• DSC - Differential scanning calorimetry
• DTA - Differential thermal analysis
• DVS - Dynamic vapour sorption

E

• EBIC - Electron beam induced current (and see IBIC: ion beam induced charge)
• EBS - Elastic (non-Rutherford) backscattering spectrometry (see RBS)
• EBSD - Electron backscatter diffraction
• ECOSY - Exclusive correlation spectroscopy
• ECT - Electrical capacitance tomography
• EDAX - Energy-dispersive analysis of x-rays
• EDMR - Electrically detected magnetic resonance, see ESR or EPR
• EDS - Energy Dispersive Spectroscopy
• EDX - Energy dispersive X-ray spectroscopy
• EELS - Electron energy loss spectroscopy
• EFTEM - Energy filtered transmission electron microscopy
• EID - Electron induced desorption
• EIT and ERT - Electrical impedance tomography and Electrical resistivity tomography
• EL - Electroluminescence
• Electron crystallography - Electron crystallography
• ELS - Electrophoretic light scattering
• ENDOR - Electron nuclear double resonance, see ESR or EPR
• EPMA - Electron probe microanalysis
• EPR - Electron paramagnetic resonance spectroscopy
• ERD or ERDA - Elastic recoil detection or Elastic recoil detection analysis
• ESCA - Electron spectroscopy for chemical analysis* see XPS
• ESD - Electron stimulated desorption
• ESEM - Environmental scanning electron microscopy
• ESI-MS or ES-MS - Electrospray ionization mass spectrometry or Electrospray mass spectrometry
• ESR - Electron spin resonance spectroscopy
• ESTM - Electrochemical scanning tunneling microscopy
• EXAFS - Extended X-ray absorption fine structure
• EXSY - Exchange spectroscopy

F

• FCS - Fluorescence correlation spectroscopy
• FCCS - Fluorescence cross-correlation spectroscopy
• FEM - Field emission microscopy
• FIB - Focused ion beam microscopy
• FIM-AP - Field ion microscopy–atom probe
• Flow birefringence - Flow birefringence
• Fluorescence anisotropy - Fluorescence anisotropy
• FLIM - Fluorescence lifetime imaging
• Fluorescence microscopy - Fluorescence microscopy
• FOSPM - Feature-oriented scanning probe microscopy
• FRET - Fluorescence resonance energy transfer
• FRS - Forward Recoil Spectrometry, a synonym of ERD
• FTICR or FT-MS - Fourier transform ion cyclotron resonance or Fourier transform mass spectrometry
• FTIR - Fourier transform infrared spectroscopy

G

• GC-MS - Gas chromatography-mass spectrometry
• GDMS - Glow discharge mass spectrometry
• GDOS - Glow discharge optical spectroscopy
• GISAXS - Grazing incidence small angle X-ray scattering
• GIXD - Grazing incidence X-ray diffraction
• GIXR - Grazing incidence X-ray reflectivity
• GLC - Gas-liquid chromatography

H

• HAADF - high angle annular dark-field imaging
• HAS - Helium atom scattering
• HPLC - High performance liquid chromatography
• HREELS - High resolution electron energy loss spectroscopy
• HREM - High-resolution electron microscopy
• HRTEM - High-resolution transmission electron microscopy

I

• IAES - Ion induced Auger electron spectroscopy
• IBA - Ion beam analysis
• IBIC - Ion beam induced charge microscopy
• ICP-AES - Inductively coupled plasma atomic emission spectroscopy
• ICP-MS - Inductively coupled plasma mass spectrometry
• Immunofluorescence - Immunofluorescence
• ICR - Ion cyclotron resonance
• IETS - Inelastic electron tunneling spectroscopy
• IGA - Intelligent gravimetric analysis
• IIX - Ion induced X-ray analysis: See Particle induced X-ray emission
• INS - Ion neutralization spectroscopy
  Inelastic neutron scattering
• IRS - Infrared spectroscopy
• ISS - Ion scattering spectroscopy
• ITC - Isothermal titration calorimetry
• IVEM - Intermediate voltage electron microscopy

L

• List of materials analysis methods (deliberate self-link)
• LALLS - Low-angle laser light scattering
• LC-MS - Liquid chromatography-mass spectrometry
• LEED - Low-energy electron diffraction
• LEEM - Low-energy electron microscopy
• LEIS - Low-energy ion scattering
• LIBS - Laser induced breakdown spectroscopy
• LOES - Laser optical emission spectroscopy
• LS - Light (Raman) scattering

M

• MALDI - Matrix-assisted laser desorption/ionization
• MBE - Molecular beam epitaxy
• MEIS - Medium energy ion scattering
• MFM - Magnetic force microscopy
• MIT - Magnetic induction tomography
• MPM - Multiphoton fluorescence microscopy
• MRFM - Magnetic resonance force microscopy
• MRI - Magnetic resonance imaging
• MS - Mass spectrometry
• MS/MS - Tandem mass spectrometry
• MSGE - Mechanically Stimulated Gas Emission
• Mössbauer spectroscopy - Mössbauer spectroscopy
• MTA - Microthermal analysis

N

• NAA - Neutron activation analysis
• Nanovid microscopy - Nanovid microscopy
• ND - Neutron diffraction
• NDP - Neutron depth profiling
• NEXAFS - Near edge X-ray absorption fine structure
• NIS - Nuclear inelastic scattering/absorption
• NMR - Nuclear magnetic resonance spectroscopy
• NOESY - Nuclear Overhauser effect spectroscopy
• NRA - Nuclear reaction analysis
• NSOM - Near-field optical microscopy

O

• OBIC - Optical beam induced current
• ODNMR - Optically detected magnetic resonance, see ESR or EPR
• OES - Optical emission spectroscopy
• Osmometry - Osmometry

P

• PAS - Positron annihilation spectroscopy
• Photoacoustic spectroscopy - Photoacoustic spectroscopy
• PAT or PACT - Photoacoustic tomography or photoacoustic computed tomography
• PAX - Photoemission of adsorbed xenon
• PC or PCS - Photocurrent spectroscopy
• Phase contrast microscopy - Phase contrast microscopy
• PhD - Photoelectron diffraction
• PD - Photodesorption
• PDEIS - Potentiodynamic electrochemical impedance spectroscopy
• PDS - Photothermal deflection spectroscopy
• PED - Photoelectron diffraction
• PEELS - parallel electron energy loss spectroscopy
• PEEM - Photoemission electron microscopy (or photoelectron emission microscopy)
• PES - Photoelectron spectroscopy
• PINEM - photon-induced near-field electron microscopy
• PIGE - Particle (or proton) induced gamma-ray spectroscopy, see Nuclear reaction analysis
• PIXE - Particle (or proton) induced X-ray spectroscopy
• PL - Photoluminescence
• Porosimetry - Porosimetry
• Powder diffraction - Powder diffraction
• PTMS - Photothermal microspectroscopy
• PTS - Photothermal spectroscopy

Q

• QENS - Quasielastic neutron scattering

R

• Raman - Raman spectroscopy
• RAXRS - Resonant anomalous X-ray scattering
• RBS - Rutherford backscattering spectrometry
• REM - Reflection electron microscopy
• RDS - Reflectance Difference Spectroscopy
• RHEED - Reflection high energy electron diffraction
• RIMS - Resonance ionization mass spectrometry
• RIXS - Resonant inelastic X-ray scattering
• RR spectroscopy - Resonance Raman spectroscopy

S

• SAD - Selected area diffraction
• SAED - Selected area electron diffraction
• SAM - Scanning Auger microscopy
• SANS - Small angle neutron scattering
• SAXS - Small angle X-ray scattering
• SCANIIR - Surface composition by analysis of neutral species and ion-impact radiation
• SCEM - Scanning confocal electron microscopy
• SE - Spectroscopic ellipsometry
• SEC - Size exclusion chromatography
• SEIRA - Surface enhanced infrared absorption spectroscopy
• SEM - Scanning electron microscopy
• SERS - Surface enhanced Raman spectroscopy
• SERRS - Surface enhanced resonance Raman spectroscopy
• SEXAFS - Surface extended X-ray absorption fine structure
• SICM - Scanning ion-conductance microscopy
• SIL - Solid immersion lens
• SIM - Solid immersion mirror
• SIMS - Secondary ion mass spectrometry
• SNMS - Sputtered neutral species mass spectrometry
• SNOM - Scanning near-field optical microscopy
• SPECT - Single photon emission computed tomography
• SPM - Scanning probe microscopy
• SRM-CE/MS - Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry
• SSNMR - Solid-state nuclear magnetic resonance
• Stark spectroscopy - Stark spectroscopy
• STED - Stimulated Emission Depletion microscopy
• STEM - Scanning transmission electron microscopy
• STM - Scanning tunneling microscopy
• STS - Scanning tunneling spectroscopy
• SXRD - Surface X-ray Diffraction (SXRD)

T

• TAT or TACT - Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography - PAT)
• TEM - transmission electron microscope/microscopy
• TGA - Thermogravimetric analysis
• TIKA - Transmitting ion kinetic analysis
• TIRFM - Total internal reflection fluorescence microscopy
• TLS - Photothermal lens spectroscopy, a type of Photothermal spectroscopy
• TMA - Thermomechanical analysis
• TOF-MS - Time-of-flight mass spectrometry
• Two-photon excitation microscopy - Two-photon excitation microscopy
• TXRF - Total reflection X-ray fluorescence analysis

U

• Ultrasound attenuation spectroscopy - Ultrasound attenuation spectroscopy
• Ultrasonic testing - Ultrasonic testing
• UPS - UV-photoelectron spectroscopy
• UV-Vis - Ultraviolet–visible spectroscopy

V

• VEDIC - Video-enhanced differential interference contrast microscopy
• Voltammetry - Voltammetry

W

• WAXS - Wide angle X-ray scattering
• WDX or WDS - Wavelength dispersive X-ray spectroscopy

X

• XAES - X-ray induced Auger electron spectroscopy
• XANES - XANES, synonymous with NEXAFS (Near edge X-ray absorption fine structure)
• XAS - X-ray absorption spectroscopy
• X-CTR - X-ray crystal truncation rod scattering
• X-ray crystallography - X-ray crystallography
• XDS - X-ray diffuse scattering
• XPEEM - X-ray photoelectron emission microscopy
• XPS - X-ray photoelectron spectroscopy
• XRD - X-ray diffraction
• XRES - X-ray resonant exchange scattering
• XRF - X-ray fluorescence analysis
• XRR - X-ray reflectivity
• XRS - X-ray Raman scattering
• XSW - X-ray standing wave technique

References

• Callister, WD (2000). Materials Science and Engineering - An Introduction. John Wiley and Sons : London. ISBN 0-471-32013-7. 
• Yao, N, ed (2007). Focused Ion Beam Systems: Basics and Applications. Cambridge University Press : Cambridge, UK. ISBN 978-052183-1994.